Title :
Linking the Verification and Validation of Complex Integrated Circuits Through Shared Coverage Metrics
Author :
Hung, Eddie ; Quinton, Brad ; Wilton, Steven J. E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
Abstract :
This paper discusses the current state of the art in measuring validation coverage through embedded instrumentation in FPGAs and presents new instrumentation that allows any cover point to be measured.
Keywords :
field programmable gate arrays; instrumentation; integrated circuit testing; FPGA; complex integrated circuits validation; complex integrated circuits verification; embedded instrumentation; shared coverage metrics; Debugging; Field programmable gate arrays; Integrated circuits; Measurement; System-on-chip; Validation; Verification; Coverage Measurement; FPGA Prototyping; Hardware Coverage; Trace-Buffers;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2013.2272693
