Title :
Readout electronics for nuclear applications (RENA) chip
Author :
Kravis, Scott D. ; Tümer, Tümay O. ; Visser, Gerard ; Maeding, Dale G. ; Yin, Shi
Author_Institution :
NOVA R&D Inc., Riverside, CA, USA
Abstract :
A Readout Electronics for Nuclear Applications (RENA) Chip has been developed to read out position sensitive solid state detectors for the nuclear instruments. This chip can also be used for medical and industrial imaging of X-rays and gamma rays. It is a multi channel monolithic mixed signal application specific integrated circuit (ASIC) chip. The RENA chip has 32 channels with low noise charge sensitive amplifier inputs. It works in pulse counting mode with good energy resolution. It also has a self triggering output which is essential for nuclear applications when the incident radiation arrive at random. Different, externally selectable, operational modes that includes a sparse readout mode is available to increase data throughput. The design of the chip and the results of tests done on a full scale prototype chip will be presented
Keywords :
X-ray detection; application specific integrated circuits; detector circuits; gamma-ray detection; nuclear electronics; position sensitive particle detectors; ASIC chip; RENA chip; Readout electronics for nuclear applications chip; X-rays; channels; chip design; data throughput; energy resolution; externally selectable operational modes; full scale prototype chip; gamma rays; incident radiation; industrial imaging; low noise charge sensitive amplifier inputs; medical imaging; multi channel monolithic mixed signal application specific integrated circuit; nuclear instruments; position sensitive solid state detectors; pulse counting mode; self triggering output; sparse readout mode; Application specific integrated circuits; Biomedical imaging; Gamma rays; Integrated circuit noise; Optical imaging; Position sensitive particle detectors; Pulse amplifiers; Readout electronics; Solid state circuits; X-rays;
Conference_Titel :
Nuclear Science Symposium, 1997. IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-7803-4258-5
DOI :
10.1109/NSSMIC.1997.672677
