Title :
A study on the 3D-weighted filtering for the 1/f noise reduction on CMOS image sensor
Author :
Hwang, Kunsu ; Nishimura, Toshi Hiro
Author_Institution :
Grad. Sch. of Inf., Production & Syst., Waseda Univ., Kitakyushu, Japan
Abstract :
We propose a new method for 1/f noise reduction in complementary metal oxide semiconductor image sensors (CMOS Image Sensors: CIS) by applying characteristics of noise distribution on time domain. The algorithm using time domain or stacking images which are focused on same pixel position are proposed to make up for the weakness of general method on edge region. Nevertheless, in the case of using of self-pixel position, some problems such as blocking effect or acquisition of images are occurred. In this study, we propose the algorithm 3D weighted filtering using multi-images through noise distribution. By using weight value on the center pixel of each 2D masks, the optimized algorithm is implemented. The purpose of proposed method is to obtain the best PSNR with minimum number of frame and minimum weight value. We have used White Gaussian noise distribution because 1/f noise has that distribution. Through the proposed algorithm, we have obtained the better PSNR than other methods as a masking method, Wiener filter and self pixel based method. The algorithm is expected that is effective for other random noise likes as photon shot noise with Poisson distribution.
Keywords :
1/f noise; AWGN; CMOS image sensors; Poisson distribution; Wiener filters; image denoising; optimisation; time-domain analysis; 1/f noise reduction; 3D-weighted filtering; CMOS image sensor; Poisson distribution; White Gaussian noise; complementary metal oxide semiconductor; image acquisition; image stacking technique; noise distribution; optimized algorithm; photon shot noise; random noise; self-pixel position; time domain algorithm; CMOS image sensors; Computational Intelligence Society; Filtering; Gaussian noise; Image sensors; Noise reduction; PSNR; Pixel; Semiconductor device noise; Stacking;
Conference_Titel :
Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-4347-5
Electronic_ISBN :
978-1-4244-4349-9
DOI :
10.1109/ISIE.2009.5218887