Title :
Characterization of Third Order Distortion in InGaAsP Optical Phase Modulator Monolithically Integrated with Balanced UTC Photodetector
Author :
Sysak, Matthew N. ; Johansson, Leif A. ; Klamkin, Jonathan ; Coldren, Larry A. ; Bowers, John E.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA
Abstract :
We demonstrate a novel, dynamic characterization technique for measuring third order distortion products in an InGaAsP phase modulator. The phase modulator exhibits an output phase IP3 of 4.4pi
Keywords :
III-V semiconductors; distortion measurement; gallium arsenide; gallium compounds; indium compounds; integrated optoelectronics; optical modulation; optical variables measurement; phase modulation; photodetectors; InGaAsP; InGaAsP optical phase modulator; balanced UTC photodetector; dynamic characterization technique; monolithic integration; third order distortion; Integrated optics; Optical attenuators; Optical distortion; Optical interferometry; Optical modulation; Optical receivers; Optical resonators; Phase distortion; Phase modulation; Photodetectors;
Conference_Titel :
Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-9555-7
Electronic_ISBN :
0-7803-9555-7
DOI :
10.1109/LEOS.2006.279104
