• DocumentCode
    3128048
  • Title

    On the fast computation of Zernike moments

  • Author

    Biswas, Rajarshi ; Biswas, Sambhunath

  • Author_Institution
    Dept. of Electron. & Commun. Eng., Netaji Subhash Eng. Coll., Kolkata, India
  • fYear
    2010
  • fDate
    4-7 July 2010
  • Firstpage
    1680
  • Lastpage
    1685
  • Abstract
    Zernike moments play a very significant role in pattern recognition, image analysis and in image processing, apart from its traditional field of optics. Among different properties, their invariance and orthogonality are attractive in many applications. Identification of different machine parts on a running conveyor belt or detection between normal and defective machine parts are of significance in industrial applications. It can also be used in identification of other subjects. Unfortunately, their direct computation is very expensive and is a major drawback in applications. In this paper, we have proposed an algorithm for fast computation of Zernike moments. As Zernike moments are orthogonal on the unit disc and applications are in the discrete domain, computations must be carried out considering discrete circles and discrete discs. Their properties play an important role for fast computation of Zernike moments. In this paper we have computed different terms of radial polynomials for different moments using a recursion, instead of computing successively all the terms of a single moment. This introduces fastness in computation. Comparison between different methods supports this fact and establishes the efficiency of the proposed method.
  • Keywords
    Zernike polynomials; image processing; Zernike moment; conveyor belt; discrete disc; fast computation; image analysis; image processing; industrial application; machine parts Identification; pattern recognition; radial polynomial; Algorithm design and analysis; Area measurement; Image analysis; Indexes; Pixel; Polynomials; Strontium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics (ISIE), 2010 IEEE International Symposium on
  • Conference_Location
    Bari
  • Print_ISBN
    978-1-4244-6390-9
  • Type

    conf

  • DOI
    10.1109/ISIE.2010.5637965
  • Filename
    5637965