Title :
Radar target identification of aircraft using structural features by correlation method
Author :
Pin, Chen Zhen ; Ping, Deng Lian ; Wen, Zhuan Zhao
Author_Institution :
Dept. of Electr. Eng., Changsha Inst. of Technol., Hunan, China
Abstract :
Under the wideband high range resolution fully polarized radar background, we present an approach to aircraft radar target classification that exploits the relationship between the physical structure of the observed and the stepped frequency backscatter response. First, we represent the radar backscatter signal measurements as a set of down-range scattering centers parameterized by a Prony modeling technique. Next, using the relative range, size, and polarimetric shape of resulting parametric scattering centers, we form a description of the “substructure” of the target. Finally, we use these “structural descriptions” of measured backscatter signal to classify the target by the Modified Correlation Method. The results of experiments show that correct identification rates of five scale model aircraft are 92.19%, 83.7%, 81.2%, 90%, 95.8%. We suggest that reliable aircraft identification is possible provided structural feature are used
Keywords :
airborne radar; backscatter; correlation methods; feature extraction; radar cross-sections; radar detection; radar signal processing; radar target recognition; Prony modeling; active radar; aircraft identification; aircraft radar target classification; correlation filters; down range scattering centers; fully polarized radar background; linearly polarised data; modified correlation method; parametric scattering centers; radar backscatter signal measurements; radar target identification; scale model aircraft; stepped frequency backscatter response; target substructure; wideband high range resolution; Airborne radar; Aircraft; Backscatter; Frequency; Polarization; Radar measurements; Radar polarimetry; Radar scattering; Scattering parameters; Signal resolution;
Conference_Titel :
Aerospace and Electronics Conference, 1995. NAECON 1995., Proceedings of the IEEE 1995 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-2666-0
DOI :
10.1109/NAECON.1995.521921