Title :
n-channel 256kb And 1 Mb EEPROMs
Author :
Nughin, A.P. ; Multsev, A.L. ; Miloshevsky, V.A.
Author_Institution :
\´\´ Submicron" Research and Production Association
Keywords :
Circuits; Degradation; EPROM; Electrons; Latches; Manufacturing; Production; Silicon; Threshold voltage; Very large scale integration;
Conference_Titel :
Solid-State Circuits Conference, 1991. Digest of Technical Papers. 38th ISSCC., 1991 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-644-6
DOI :
10.1109/ISSCC.1991.689138
