DocumentCode :
3128751
Title :
Short-channel like effects in Schottky barrier carbon nanotube field-effect transistors
Author :
Appenzeller, J. ; Knoch ; Martel, R. ; Derycke, V. ; Wind, S. ; Avouris, Ph.
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
2002
fDate :
8-11 Dec. 2002
Firstpage :
285
Lastpage :
288
Abstract :
This study shows new results on vertically scaled carbon nanotube field-effect transistors (CNFETs) focusing in particular on short-channel effects. We show clear evidence that state-of-the-art CNFETs behave as Schottky barrier (SB) transistors and that SB-CNFETs exhibit a very distinct scaling behavior. The relevant scaling rules that have to be applied to ensure the desired device operation and to avoid short-channel-like effects of CNFETs are discussed for the first time.
Keywords :
Schottky barriers; carbon nanotubes; field effect transistors; nanoelectronics; C; Schottky barrier carbon nanotube FET; Schottky barrier transistors; scaling behavior; short-channel effects; vertically scaled carbon nanotube FETs; CNTFETs; Carbon nanotubes; Electric variables; FETs; Focusing; Nanoscale devices; Schottky barriers; Semiconductivity; Silicon; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2002. IEDM '02. International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7462-2
Type :
conf
DOI :
10.1109/IEDM.2002.1175834
Filename :
1175834
Link To Document :
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