Title :
Implementation of a Fluctuation Smoothing Production Control Policy in IBM´s 200mm Wafer Fab
Author :
Morrison, J.R. ; Campbell, B. ; Dews, E. ; LaFreniere, J.
Author_Institution :
Member, IEEE, Ph.D., IBM Corporation, Essex Junction, VT 05452 USA and adjunct to the University of Vermont Department of Electrical and Computer Engineering, Burlington, VT 05405 USA (phone: 802-769-2196; fax: 802-769-9452; e-mail: jrmorr@us.ibm.com).
Abstract :
Efficient operation of IBM Vermont’s 200mm semiconductor wafer fabrication facility is essential to achieve the objective of transforming the site into a world class foundry manufacturer. To that end, we develop a fluctuation smoothing for the variation of cycle time (FSVCT) production control policy capable of allowing for a diversity of cycle time commitments. The policy directs which lot should next receive processing when a tool becomes available. In the absence of a validated cycle time model for the fabricator, we obtain estimates of achievable cycle time performance in the presence of business constraints on the cycle times of certain lots via a consequence of Little’s law. The mean and variation of cycle time implications for IBM Vermont’s facility are highlighted.
Keywords :
Fabrication; Fluctuations; Foundries; Manufacturing processes; Production control; Production facilities; Profitability; Semiconductor device manufacture; Semiconductor device modeling; Smoothing methods;
Conference_Titel :
Decision and Control, 2005 and 2005 European Control Conference. CDC-ECC '05. 44th IEEE Conference on
Conference_Location :
Seville, Spain
Print_ISBN :
0-7803-9567-0
DOI :
10.1109/CDC.2005.1583411
