Title :
Accurate measurement of high-speed package and interconnect parasitics
Author :
Carlton, D.E. ; Gleason, K.R. ; Hopkins, R. ; Jones, K. ; Noonan, K. ; Strid, E.W.
Author_Institution :
Cascade Microtech Inc., Beaverton, OR, USA
Abstract :
Various ideal structures such as small resistors, shorts, and transmission lines are used to verify the calibration of the measurement instrument at the probe tip. Typical measurements of package and interconnect performance are demonstrated, and sample measurements are made, including time domain reflectometry, propagation delay, isolation, and bypassing of power lines. Measurement results are shown
Keywords :
calibration; integrated circuit testing; packaging; probes; time measurement; bypassing of power lines; calibration; ideal structures; interconnect parasitics; isolation; measurement instrument; package parasites; probe tip; probing techniques; propagation delay; subnanosecond risetimes; time domain reflectometry; Calibration; Instruments; Packaging; Power measurement; Power transmission lines; Probes; Reflectometry; Resistors; Time measurement; Transmission line measurements;
Conference_Titel :
Custom Integrated Circuits Conference, 1988., Proceedings of the IEEE 1988
Conference_Location :
Rochester, NY
DOI :
10.1109/CICC.1988.20920