• DocumentCode
    3129161
  • Title

    Miniature radio frequency ion trap mass spectrometry

  • Author

    Maas, J.D. ; Xu, Wei ; Hendricks, Paul ; Chappell, William J.

  • Author_Institution
    Electr. Eng. Dept., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    1636
  • Lastpage
    1639
  • Abstract
    RF ion traps are useful in chemical analysis and have added benefits when scaled to smaller dimensions. For a miniature ion trap it is ideal to be able to predict the performance of the ion trap prior to fabrication in order to save time and optimize parameters. We have developed both the simulation and fabrication of scaled ion traps. The simulation tool allows us to model miniature ion traps in order to predict how the frequency and amplitude of the RF voltage could be scaled in order to optimize the performance of the ion trap. We demonstrate the performance of a scaled ion trap array fabricated through the integration of stereolithography on circuit board and compare its performance with our ion trajectory simulator.
  • Keywords
    particle traps; radiofrequency spectra; stereolithography; chemical analysis; circuit board; ion trajectory simulator; miniature radio frequency ion trap mass spectrometry; stereolithography; Analytical models; Chemical sensors; Drugs; Fabrication; Mass spectroscopy; Quantum computing; Radio frequency; Stability; Stereolithography; Voltage; Chemical analysis; Ion trap; Stereolithography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5516819
  • Filename
    5516819