Title :
Analyzing ordered categorical data from orthogonal array [chip resistor QC]
Author :
Jeng, Yam-Chyn ; Guo, Shin-Ming
Author_Institution :
Dept. of Ind. Manage., Kaohsiung Polytech. Inst., Taiwan
Abstract :
This paper studies a quality improvement case for an extremely thin and light chip resistor RC06. We use an L18(21×37) orthogonal array allocating 8 control factors in an experimental plan. The quality response data are inevitably considered to be ordered categorical. Six categories are classified for the quality of chips. Both Taguchi´s accumulation analysis method (1966) and Nair´s scoring scheme (1986) are employed in analyzing the data. Furthermore, we develop a weighted probability scoring scheme and a signal to noise (SN) ratio to reach an optimal solution. Finally, a comparison among the three approaches is made
Keywords :
electron device manufacture; probability; production control; quality control; resistors; statistical analysis; ANOVA; Nair´s scoring scheme; S/N ratio; Taguchi method; accumulation analysis; chip resistor RC06; ordered categorical data; orthogonal array; quality control; weighted probability scoring scheme; Analysis of variance; Computational complexity; Data analysis; Dispersion; Electrical resistance measurement; Mass production; Resistors; Semiconductor device measurement; Signal to noise ratio; Tin;
Conference_Titel :
Systems, Man and Cybernetics, 1995. Intelligent Systems for the 21st Century., IEEE International Conference on
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-2559-1
DOI :
10.1109/ICSMC.1995.538211
