• DocumentCode
    3129396
  • Title

    Investigation of parasitic electromagnetic radiation in multilayer packages and MCMs

  • Author

    Arnaudov, Radosvet G. ; Baev, Slavi R. ; Avdjiiski, Bojidar G.

  • Author_Institution
    RaySat BG Ltd., Sofia, Bulgaria
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    286
  • Lastpage
    291
  • Abstract
    Electromagnetic radiation from parallel-plate planes of power-return and ground pairs are investigated. Such structures are widely used in microwave multilayer packages, MCMs and could be the source of considerable electromagnetic interference (EMI) or simultaneously switching noise (SSI). Effective methods should be applied for damping and elimination of the radiated fields, especially in small areas and volumes. The developed three-layered LTCC microwave package possesses two separate grounding planes on different layer levels, connected through multiple vias. The estimation of the electromagnetic field distribution - near field, and radiation pattern - far field, are conducted by full-wave analysis. The article also discusses the influence of the layout, vias grid and material properties on the performance of the exemplary structure in the frequency band of interest - 10 to 30 GHz.
  • Keywords
    electromagnetic interference; electromagnetic waves; electronics packaging; MCM; electromagnetic interference; full-wave analysis; multilayer packages; parasitic electromagnetic radiation; radiated emissions; simultaneously switching noise; Damping; Electromagnetic analysis; Electromagnetic fields; Electromagnetic interference; Electromagnetic radiation; Grounding; Material properties; Nonhomogeneous media; Packaging; Pattern analysis; LTCC; MCM; Microwave packages; electromagnetic interference (EMI); electronic band-gap structures (EBG); full-wave analysis; propagation constant; radiated emissions; simultaneous switching noise interference (SSI); wave number;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382118
  • Filename
    5382118