Title :
A Study on the Failure Intensity of Different Software Faults
Author :
Shima, Kazuyuki ; Takada, Shingo ; Matsumoto, Ken´ichi ; Torii, Koji
Author_Institution :
Graduate School of Information Scienc, Nara Institute of Science and Technology
Keywords :
Failure intensity, testing, software reliability growth model, hyperexponential SRGM, Littlewood model, gamma distribution; Calendars; Delay; Fault detection; Frequency; Information science; Permission; Predictive models; Programming; Software reliability; Software testing;
Conference_Titel :
Software Engineering, 1997., Proceedings of the 1997 International Conference on
Print_ISBN :
0-89791-914-9
DOI :
10.1109/ICSE.1997.610215