DocumentCode
3129807
Title
Scheduling transient periods of dual-armed cluster tools
Author
Lee, Jun-Ho ; Kim, Hyun-Jung ; Lee, Tae-Eog
Author_Institution
Dept. of Ind. & Syst. Eng., KAIST, Daejeon, South Korea
fYear
2012
fDate
5-8 Aug. 2012
Firstpage
1569
Lastpage
1574
Abstract
Modern semiconductor manufacturing industry tends to reduce the lot size; that is, a lot has a small number of identical wafers, because of demands for small lots and an increased die yield per wafer due to the larger wafer size. Therefore, cluster tools for wafer processing, mostly repeating identical work cycles, are subject to frequent lot changes. We thus examine dual-armed cluster tool scheduling problems for transient periods. We first develop a Petri net model for the tool´s operational behavior in a transient period. We then develop a mixed integer programming model for finding an optimal schedule in terms of makespan of a transient period. We also examine how to adapt the conventional swap sequence, which is mostly used for scheduling steady work cycles, for a transient period. This is important to guarantee the compatibility between schedules of steady-state and transient periods because most tools are scheduled by the swap sequence in steady-state periods. To do this, we identify a deadlock-free condition and also propose two efficient scheduling algorithms by modifying the swap sequence. Finally, we experimentally analyze the efficiency of the proposed algorithms.
Keywords
Petri nets; integer programming; integrated circuit yield; lot sizing; scheduling; semiconductor device manufacture; Petri net model; deadlock-free condition; die yield; dual-armed cluster tool scheduling problem; identical wafer; lot size reduction; mixed integer programming model; operational behavior; optimal scheduling; semiconductor manufacturing industry; steady work cycle scheduling; steady-state period; swap sequence modification; transient period scheduling; wafer processing; Job shop scheduling; Optimal scheduling; Robots; Scheduling algorithms; Semiconductor device modeling; System recovery; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Mechatronics and Automation (ICMA), 2012 International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4673-1275-2
Type
conf
DOI
10.1109/ICMA.2012.6284370
Filename
6284370
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