Title :
Breakthroughs in chip embedding technologies leading to the emergence of further miniaturised system-in-packages
Author :
Manessis, Dionysios ; Boettcher, Lars ; Ostmann, Andreas ; Karaszkiewicz, Stefan ; Reichl, Herbert
Author_Institution :
Microperipheric Res. Center, Tech. Univ. of Berlin (TUB), Berlin, Germany
Abstract :
Embedding of semiconductor chips into organic substrates allows a very high degree of miniaturization by stacking multiple layers of embedded thin components. This paper shows the realisation of embedded chip QFN-packages (Quad Flat No-Lead) with a size of 10mmx10mm which were manufactured at prototype level at 10"x14" panels. The embedded chip in the package has a pad pitch of 100¿m and the resultant QFN package has a total number of 84I/Os at 400¿m footprint pitch. State-of-the-art developments in semi-additive processes by employment of laser-direct- imaging technology (LDI) have demonstrated very fine 18¿m lines with 10¿m space between them for the final package copper routing. The work in this paper provides evidence for chip embedding capability at very fine chip pad pitch of 100¿m and discusses the technology limits. The present work at research prototype level frames the main activities in the EU-Hermes project towards the industrialisation of chip embedding technologies.
Keywords :
system-in-package; chip embedding technologies; copper routing; embedded chip QFN-packages; embedded thin components; laser-direct-imaging technology; miniaturised system-in-packages; organic substrates; quad flat no-lead; semiadditive processes; semiconductor chips; Copper; Employment; Packaging; Prototypes; Pulp manufacturing; Routing; Semiconductor device manufacture; Space technology; Stacking; Substrates; 3D packaging; Chip in Polymer; PCB technology; System in Package; embedded chips;
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-4341-3
Electronic_ISBN :
978-1-4244-4342-0
DOI :
10.1109/IMPACT.2009.5382147