DocumentCode
3130043
Title
Exploiting resonant behavior to reduce inductive noise
Author
Powell, Michael D. ; Vijaykumar, T.N.
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear
2004
fDate
19-23 June 2004
Firstpage
288
Lastpage
299
Abstract
Inductive noise in high-performance microprocessors is a reliability issue caused by variations in processor current (di/dt) which are converted to supply-voltage glitches by impedances in the power-supply network. Inductive noise has been addressed by using decoupling capacitors to maintain low impedance in the power supply over a wide range of frequencies. However, even well-designed power supplies exhibit (a few) peaks of high impedance at resonant frequencies caused by RLC resonant loops. Previous architectural proposals adjust current variations by controlling instruction fetch and issue, trading off performance and energy for noise reduction. However, the proposals do not consider some conceptual issues and have implementation challenges. The issues include requiring fast response, responding to variations that do not threaten the noise margins, or responding to variations only at the resonant frequency while the range of high impedance extends to a resonance band around the resonant frequency. While previous schemes reduce the magnitude of variations, our proposal, called resonance tuning, changes the frequency of current variations away from the resonance band to a non-resonant frequency to be absorbed by the power supply. Because inductive noise is a resonance problem, resonance tuning reacts only to repeated variations in the resonance band, and not to isolated variations. Reacting after a few repetitions allows more time for the response and reduces unnecessary responses, decreasing performance and energy loss.
Keywords
integrated circuit modelling; integrated circuit noise; integrated circuit reliability; microprocessor chips; RLC resonant loops; decoupling capacitors; high-performance microprocessors; impedance maintenance; inductive noise reduction; microprocessor reliability; power supply; power-supply network impedances; processor current variations; resonance band; resonance tuning; resonant behavior; resonant frequency; supply-voltage glitches; Capacitors; Impedance; Maintenance; Microprocessors; Noise reduction; Power supplies; Proposals; Resonance; Resonant frequency; Tuning;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Architecture, 2004. Proceedings. 31st Annual International Symposium on
ISSN
1063-6897
Print_ISBN
0-7695-2143-6
Type
conf
DOI
10.1109/ISCA.2004.1310782
Filename
1310782
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