• DocumentCode
    3130140
  • Title

    Guarding trace and ground via-hole analysis for DDR interface designed in high-speed packages

  • Author

    Sung, Robert ; Chiang, Kevin ; Lai, Jeng-Yuan ; Wang, Yu-Po

  • Author_Institution
    Siliconware Precision Ind., Taichung, Taiwan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    136
  • Lastpage
    139
  • Abstract
    Because of the miniaturization on the demand, the area for the layout design is decreasing. But, more and more functions are integrated. In this situation, high-speed design, for example, the DDR access interface is easy to cause simultaneous switching noises (SSN). In this paper, some analysis on this design was evaluated. The major target in our works is the DDR interface. We studied some patterns on package substrate. The major difference is the guarding traces and position of the ground via-hole. In the initial, 2D electromagnetic tool was used to estimate the amount of nets that are needed in the simulation. Inductive coupling (Lm) and capacitive coupling (Cm) are included. Then, by 3D electromagnetic tool, the circuit-model could be extracted from the 3D model. After that, spice was used for SSN simulation. In the final results, proposed solutions for the guarding nets can be reviewed. Larger inductance and coupling effects will make the signal transmission worse. Introducing guard-trace(s) can reduce these effects. Hence, improve the transmission quality. This result could be a reference for DDR interface design in high-speed application of packages.
  • Keywords
    circuit layout; electronics packaging; 2D electromagnetic tool; DDR access interface; capacitive coupling; ground via-hole analysis; guarding trace; high-speed packages; inductive coupling; layout design; simultaneous switching noises; Packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382159
  • Filename
    5382159