DocumentCode
3130239
Title
Film type solder mask evaluation for flip chip BGA
Author
Fu, Chun Hsien ; Chang, David ; Chen, Carl
Author_Institution
Siliconware Precision Ind. Co., Ltd., Taichung, Taiwan
fYear
2009
fDate
21-23 Oct. 2009
Firstpage
121
Lastpage
123
Abstract
In this paper, the effects of solder mask are studied and two types of solder mask are used in this study, include liquid type and dry film type. Ether liquid type or dry film type solder mask has its own advantage and disadvantage. For liquid type, it is a mature process and can be operated without vacuum environment. However, for dry film type, it needs to be operated in vacuum environment for preventing contamination and void, but dry film type could get better solder mask thickness uniformity and smaller roughness. The test vehicle of this study is 42.5 mm*42.5 mm Flip Chip Ball Grid Array (FCBGA) with 150 um bump pitch composed with different solder mask material. Two kinds of substrate are evaluated in this study: liquid type solder mask (S/M1), dry film type solder mask (S/M2). Substrate roughness, adhesion test, PKG level coplanarity, PKG warpage and reliability test are conducted to evaluate the effect of dry film type and liquid type solder mask on substrate and PKG. The results shows that dry film type solder mask has lower roughness than liquid type. For the part of adhesion test between underfill and solder mask, dry film type solder mask shows similar adhesion strength to liquid type. Shadow moire¿ is employed to measure warpage and the results shows substrate with dry film solder mask has lower warpage. For the reliability life test, two packages are subjected to pre-condition of JEDEC MSL Level 3, TCT1000, HTSL1000 and HAST168, and both two packages passes reliability test.
Keywords
ball grid arrays; flip-chip devices; semiconductor device reliability; solders; surface contamination; HAST168; HTSL1000; JEDEC MSL Level 3; PKG level coplanarity; PKG warpage; Shadow moire; TCT1000; adhesion strength; adhesion test; contamination prevention; dry film type solder mask; film type solder mask evaluation; flip chip BGA; flip chip ball grid array; liquid type solder mask; reliability life test; size 42.5 mm; solder mask material; substrate roughness; vacuum environment; void prevention; Adhesives; Conducting materials; Conductive films; Contamination; Electronics packaging; Flip chip; Life testing; Materials testing; Substrates; Vehicles; Solder mask; Substrate; Warpage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location
Taipei
Print_ISBN
978-1-4244-4341-3
Electronic_ISBN
978-1-4244-4342-0
Type
conf
DOI
10.1109/IMPACT.2009.5382163
Filename
5382163
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