DocumentCode
3130310
Title
Harmonic Bounds in Atomic Force Microscopy
Author
Materassi, D. ; Salapaka, M. ; Basso, M.
Author_Institution
Dipartimento di Sistemi e Informatica, Università di Firenze (materassi@control.dsi.unifi.it)
fYear
2005
fDate
12-15 Dec. 2005
Firstpage
8221
Lastpage
8226
Abstract
The paper addresses the problem of evaluating magnitude bounds on higher harmonics of the periodic tip oscillation in an Atomic Force Microscope (AFM). The suggested approach considers a class of nonlinearities well suited to the tip-sample interaction in AFMs, and reduces the bounding problem to an optimization problem. For a relaxation of the problem a solution in a closed form is provided and reduces the conservativeness of estimates existing in literature.
Keywords
Atomic force microscopy; Instruments; Nanotechnology; Optical imaging; Phase measurement; Propulsion; Resonance; Resonant frequency; Surface topography; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 2005 and 2005 European Control Conference. CDC-ECC '05. 44th IEEE Conference on
Print_ISBN
0-7803-9567-0
Type
conf
DOI
10.1109/CDC.2005.1583493
Filename
1583493
Link To Document