DocumentCode :
3130310
Title :
Harmonic Bounds in Atomic Force Microscopy
Author :
Materassi, D. ; Salapaka, M. ; Basso, M.
Author_Institution :
Dipartimento di Sistemi e Informatica, Università di Firenze (materassi@control.dsi.unifi.it)
fYear :
2005
fDate :
12-15 Dec. 2005
Firstpage :
8221
Lastpage :
8226
Abstract :
The paper addresses the problem of evaluating magnitude bounds on higher harmonics of the periodic tip oscillation in an Atomic Force Microscope (AFM). The suggested approach considers a class of nonlinearities well suited to the tip-sample interaction in AFMs, and reduces the bounding problem to an optimization problem. For a relaxation of the problem a solution in a closed form is provided and reduces the conservativeness of estimates existing in literature.
Keywords :
Atomic force microscopy; Instruments; Nanotechnology; Optical imaging; Phase measurement; Propulsion; Resonance; Resonant frequency; Surface topography; Upper bound;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control, 2005 and 2005 European Control Conference. CDC-ECC '05. 44th IEEE Conference on
Print_ISBN :
0-7803-9567-0
Type :
conf
DOI :
10.1109/CDC.2005.1583493
Filename :
1583493
Link To Document :
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