• DocumentCode
    3130310
  • Title

    Harmonic Bounds in Atomic Force Microscopy

  • Author

    Materassi, D. ; Salapaka, M. ; Basso, M.

  • Author_Institution
    Dipartimento di Sistemi e Informatica, Università di Firenze (materassi@control.dsi.unifi.it)
  • fYear
    2005
  • fDate
    12-15 Dec. 2005
  • Firstpage
    8221
  • Lastpage
    8226
  • Abstract
    The paper addresses the problem of evaluating magnitude bounds on higher harmonics of the periodic tip oscillation in an Atomic Force Microscope (AFM). The suggested approach considers a class of nonlinearities well suited to the tip-sample interaction in AFMs, and reduces the bounding problem to an optimization problem. For a relaxation of the problem a solution in a closed form is provided and reduces the conservativeness of estimates existing in literature.
  • Keywords
    Atomic force microscopy; Instruments; Nanotechnology; Optical imaging; Phase measurement; Propulsion; Resonance; Resonant frequency; Surface topography; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 2005 and 2005 European Control Conference. CDC-ECC '05. 44th IEEE Conference on
  • Print_ISBN
    0-7803-9567-0
  • Type

    conf

  • DOI
    10.1109/CDC.2005.1583493
  • Filename
    1583493