• DocumentCode
    3130763
  • Title

    Three-Dimensional Digital Image Analysis of Immunostained Neurons in Thick Tissue Sections

  • Author

    Selinummi, Jyrki ; Ruusuvuori, Pekka ; Lehmussola, Antti ; Huttunen, Heikki ; Harja, Olli Yli ; Miettinen, Riitta

  • Author_Institution
    Inst. of Signal Process., Tampere Univ. of Technol.
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    4783
  • Lastpage
    4786
  • Abstract
    Detection and three dimensional reconstruction of cell structures from brightfield microscopy video clips using digital image processing algorithms is presented. While the confocal microscopy offers an efficient technique for three dimensional measurements, extensive and repeated measurements are still often better to be performed using permanent staining and brightfield microscopy. By processing of brightfield microscopy videos using automated and efficient digital image processing algorithms, the tedious task of manual analysis can be avoided. Our two-stage algorithm is applied for 1) cell soma detection and 2) identification of the 3D structure of entire neurons. To verify the results, we present 3D reconstructions of the detected cells
  • Keywords
    biological tissues; biomedical measurement; biomedical optical imaging; cellular biophysics; image reconstruction; medical image processing; neurophysiology; optical microscopy; 3D cell structure identification; brightfield microscopy video clips; cell soma detection; confocal microscopy; digital image processing algorithms; immunostained neurons; permanent staining microscopy; thick tissue sections; three dimensional image reconstruction; three-dimensional digital image analysis; Algorithm design and analysis; Digital images; Image analysis; Image processing; Image reconstruction; Immune system; Laboratories; Microscopy; Neurons; Signal processing algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.259419
  • Filename
    4462871