Title :
Assessment of silicon MOS and carbon nanotube FET performance limits using a general theory of ballistic transistors
Author :
Guo, Jing ; Datta, Supriyo ; Lundstrom, Mark ; Brink, Markus ; McEuen, Paul ; Javey, Ali ; Dai, Hongjie ; Kim, Hyoungsub ; McIntyre, Paul
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
A simple model for ballistic nanotransistors, which extends previous work by treating both the charge control and the quantum capacitance limits of MOSFET-like transistors, is presented. We apply this new model to MOSFET-like carbon nanotube FETs (CNTFETs) and to MOSFETs at the scaling limit. The device physics for operation at ballistic and quantum capacitance limits are explored. Based on the analysis of recently reported CNTFETs, we compare CNTFETs to MOSFETs. The potential performance advantages over Si that might be achieved at the scaling limit are established by using the new model.
Keywords :
MOSFET; ballistic transport; carbon nanotubes; field effect transistors; nanoelectronics; semiconductor device models; silicon; C; FET performance limits; MOSFET-like C nanotube FETs; Si; Si MOSFETs; ballistic nanotransistors; ballistic transistor theory; carbon nanotube FET; charge control; device physics; model; quantum capacitance limits; scaling limit; CNTFETs; FETs; MOSFETs; Measurement; Physics; Quantum capacitance; Quantum computing; Quantum mechanics; Schottky barriers; Silicon;
Conference_Titel :
Electron Devices Meeting, 2002. IEDM '02. International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7462-2
DOI :
10.1109/IEDM.2002.1175937