DocumentCode
3130820
Title
Manufacturing and testing of the sintered miniature loop heat pipe
Author
Wu, Shen-Chun ; Sheng-Hao Chen ; Wei, Kai-Hung ; Yeh, Chien-Chih ; Chen, Sheng-Hao
Author_Institution
Dept. of Mechatron., Energy & Aerosp. Eng., Nat. Defense Univ., Taoyuan, Taiwan
fYear
2009
fDate
21-23 Oct. 2009
Firstpage
352
Lastpage
355
Abstract
In recent years, the high-power electronic devices cause the increasing demand of heat dissipation. Loop heat pipe (LHP), which possesses the advantages including high transfer capacity, long transport distance, self-priming, and active control, has a great potential for electronic cooling. However, with the miniaturizing of a LHP for electronic cooling, its performance will become more important to the capillary structure (wick) in the evaporator. The purpose of this study is to investigate the effect of the parameters of the metal sintering capillary structure by changing the sintering temperature (500~700°C) and sintering time (90~180mins) in the LHP. The results showed that there existed a better combination of manufacturing parameters by which the performance of the LHP would achieve a fine effect. According to an actual demand for electronic cooling, a miniature LHP was fabricated with the evaporator outer diameter of 15.5mm and the evaporator length of 65mm. The testing results showed that, at the allowable working temperature of 85°C, the maximum heat transfer capacity was up to 300 W and the thermal resistance was 0.29°C/W.
Keywords
cooling; heat pipes; sintering; thermal resistance; active control; electronic cooling; evaporator; heat dissipation; high power electronic devices; long transport distance; manufacturing parameters; maximum heat transfer capacity; metal sintering capillary structure; self-priming; sintered miniature loop heat pipe; temperature 500 degC to 700 degC; thermal resistance; time 90 min to 180 min; Manufacturing; Testing; capillary structure; loop heat pipe; sintering;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location
Taipei
Print_ISBN
978-1-4244-4341-3
Electronic_ISBN
978-1-4244-4342-0
Type
conf
DOI
10.1109/IMPACT.2009.5382189
Filename
5382189
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