DocumentCode :
3130874
Title :
A transparent solution for providing remote wired or wireless communication to board and system level boundary-scan architectures
Author :
Collins, Peter ; Reis, Ilkka ; Simonen, Mikko ; Van Houcke, Marc
Author_Institution :
JTAG Technol. UK, Cardington
fYear :
2005
fDate :
8-8 Nov. 2005
Lastpage :
16
Abstract :
The IEEE 1149.1 boundary-scan standard has become an increasingly important architecture for overcoming many of the testability issues facing today´s complex high density designs. However, it is becoming increasingly difficult in modern systems to gain access to the inherent board level boundary-scan infrastructure through the edge connector. Subsequently it has become imperative that an alternative solution must be found to access the inherent board level boundary-scan infrastructure using the target designs existing serial communication protocol. This paper describes a transparent solution for providing remote access to single board or multi-board boundary-scan architectures, utilizing the existing wired or wireless communication protocol
Keywords :
IEEE standards; boundary scan testing; built-in self test; design for testability; IEEE 1149.1 boundary-scan standard; board level boundary-scan infrastructure; boundary-scan architectures; serial communication protocol; wired communication; wireless communication; Access protocols; Automatic testing; Built-in self-test; Connectors; Design for testability; Life testing; Logic testing; Pins; System testing; Wireless communication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
Type :
conf
DOI :
10.1109/TEST.2005.1583957
Filename :
1583957
Link To Document :
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