DocumentCode
3130901
Title
Definitions of jitter measurement terms and relationships
Author
Zamek, Iliya ; Zamek, Steve
Author_Institution
Altera Corp., San Jose, CA
fYear
2005
fDate
8-8 Nov. 2005
Lastpage
34
Abstract
Different jitters terms are widely used for jitter characterization, -edge jitter, cycle-to-cycle jitter, period jitter are just a few of them. These jitter conventions have been studied in many publications considering jitter measurements, but they lack a common mathematical basis which should include both - the relations of these terms with jitter spectrum typical for measurement practice, and some jitter conversions which time domain measurement instruments (TDI) depend on for instrument performance and synchronization. We generalize the common theoretical basis, which establishes the dependencies between different jitter terms and jitter spectrum. We demonstrate and explain some effects of typical jitter term measurements observed in measurement practice. The obtained results are important for correct jitter measurements and specifications in clock, SOC, communication, ATE, high-speed digital test, etc
Keywords
electric noise measurement; jitter; spectral analysis; jitter characterization; jitter conversions; jitter measurement; jitter specifications; jitter spectrum; jitters terms; time domain measurement instruments; Clocks; Instruments; Noise measurement; Phase measurement; Phase noise; Synchronization; Tellurium; Testing; Time measurement; Timing jitter;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location
Austin, TX
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1583959
Filename
1583959
Link To Document