• DocumentCode
    3130901
  • Title

    Definitions of jitter measurement terms and relationships

  • Author

    Zamek, Iliya ; Zamek, Steve

  • Author_Institution
    Altera Corp., San Jose, CA
  • fYear
    2005
  • fDate
    8-8 Nov. 2005
  • Lastpage
    34
  • Abstract
    Different jitters terms are widely used for jitter characterization, -edge jitter, cycle-to-cycle jitter, period jitter are just a few of them. These jitter conventions have been studied in many publications considering jitter measurements, but they lack a common mathematical basis which should include both - the relations of these terms with jitter spectrum typical for measurement practice, and some jitter conversions which time domain measurement instruments (TDI) depend on for instrument performance and synchronization. We generalize the common theoretical basis, which establishes the dependencies between different jitter terms and jitter spectrum. We demonstrate and explain some effects of typical jitter term measurements observed in measurement practice. The obtained results are important for correct jitter measurements and specifications in clock, SOC, communication, ATE, high-speed digital test, etc
  • Keywords
    electric noise measurement; jitter; spectral analysis; jitter characterization; jitter conversions; jitter measurement; jitter specifications; jitter spectrum; jitters terms; time domain measurement instruments; Clocks; Instruments; Noise measurement; Phase measurement; Phase noise; Synchronization; Tellurium; Testing; Time measurement; Timing jitter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2005. Proceedings. ITC 2005. IEEE International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-9038-5
  • Type

    conf

  • DOI
    10.1109/TEST.2005.1583959
  • Filename
    1583959