Title :
Jitter transformations in measurement instruments and discrepancies between measurement results
Author :
Zamek, Iliya ; Zamek, Steve
Author_Institution :
Altera Corp., San Jose, CA
Abstract :
Jitter measurement with different time domain instruments (TDI) have been extensively studied in numerous works. These works covered different measurement instruments including equivalent-time (ETO) or sampling and real-time oscilloscopes (RTO), time interval analyzers (TIA), etc. However, in the published papers there is a lack of analysis of jitter transformations in different TDIs. Some publications pointed out discrepancies between measurements results carried out by different instruments, but the reasons of the discrepancies have not been explained. In this paper we research jitter transformations for typical jitter terms measurements with different instruments. It is demonstrated that jitter transformation depends both - on the measured jitter term, and the type of measurement instrument used. It is shown that jitter undergoes different transformations in different instruments. These transformation models are studied. The distinctions of both deterministic and random jitter (DJ and RJ respectively) transformations of measurements using various instruments are illustrated and analyzed. The experiments are discussed. The obtained results help to explain the discrepancies between different TDI measurement results and establish correct jitter measurement methodology
Keywords :
electric noise measurement; measurement errors; network analysers; oscilloscopes; spectral analysis; time-domain analysis; timing jitter; deterministic jitter; jitter measurement; jitter terms measurements; jitter transformations; measurement instruments; random jitter; time domain instruments; transformation models; Clocks; Instruments; Jitter; Measurement errors; Oscilloscopes; Phase noise; Sampling methods; Testing; Time measurement; Velocity measurement;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1583960