Title :
Third-Order Phase Lock Loop Measurement and Characterization
Author :
Ma, Jun ; Li, Mike ; Marlett, Mark
Keywords :
Curve fitting; Data communication; Filters; Frequency domain analysis; Frequency measurement; Phase locked loops; Phase measurement; Time measurement; Transfer functions; Voltage-controlled oscillators;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1583961
