DocumentCode
3130945
Title
Source Localization of Subtopographic Brain Maps for Event Related Potentials (ERP)
Author
Duru, Adil Deniz ; Bayram, Ali ; Demiralp, Tamer ; Ademoglu, Ahmet
Author_Institution
Biomed. Eng. Inst., Bogazici Univ., Istanbul
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
4832
Lastpage
4834
Abstract
Localization of the cognitive activity in the brain is one of the major problems in neuroscience. Current techniques for neuro-imaging are based on functional magnetic resonance imaging (fMRI), positron emission tomography (PET), and event related potential (ERP) recordings. The highest temporal resolution is achieved by ERP, which is crucial for temporal localization of activities. However, the spatial resolution of scalp topography for ERP is low. There is a severe limitation for the parametric inverse solution algorithms that they can only perform well for the temporally uncorrelated sources. In this study, a spatial decomposition method is proposed to separate the temporally correlated sources using their topographies prior to their localization
Keywords
bioelectric potentials; cognition; electroencephalography; inverse problems; medical signal processing; neurophysiology; signal resolution; source separation; wavelet transforms; EEG; PET; cognitive activity; event related potential recordings; event related potentials; functional magnetic resonance imaging; neuro-imaging; parametric inverse solution algorithms; positron emission tomography; scalp topography; source localization; spatial resolution; spatial wavelet decomposition method; subtopographic brain maps; temporal localization; temporal resolution; temporally correlated sources; Brain mapping; Enterprise resource planning; Magnetic recording; Magnetic resonance imaging; Neuroimaging; Neuroscience; Positron emission tomography; Scalp; Spatial resolution; Surfaces; Brain Topography; ERP; Source Localization; Spatial Wavelet Decomposition;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.260824
Filename
4462883
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