DocumentCode :
3130946
Title :
A 16-bit resistor string DAC with full-calibration at final test
Author :
Parthasarathy, Kumar ; Kuyel, Turker ; Yu, Zhongjun ; Chen, Degang ; Geiger, Randy
Author_Institution :
Texas Instrum., Dallas, TX
fYear :
2005
fDate :
8-8 Nov. 2005
Lastpage :
75
Abstract :
A novel, on-chip transfer function calibration scheme is introduced to the classical resistor string DAC architecture. A 16-bit, quad channel, resistor string DAC with exceptional accuracy is fabricated on an ultra-low-cost, 0.5mum, 5V CMOS process. Monotonicity is achieved by voltage interpolation and absolute accuracy errors are improved by 100times using full transfer function calibration at final test. An on-chip arithmetic logic unit (ALU) linearly interpolates calibration coefficients saving memory, and a high-effective-resolution cal-DAC preserves differential linearity (DNL) performance while correcting integral linearity errors. Separate cal-DACs correct for offset and gain errors. Each DAC channel occupies 4mm2 die area, consumes 750muA, and settles in 10mus, while offering up to +/- 500muV absolute accuracy across its transfer curve. The chip has built-in DFT and uses one time programmable memory with read-back. The device can be calibrated and tested with a single insertion at final test. This paper discusses the architecture, testing, calibration and optimization details
Keywords :
CMOS integrated circuits; calibration; design for testability; digital arithmetic; digital-analogue conversion; error correction; resistors; transfer functions; 0.5 micron; 10 mus; 16 bit; 5 V; 750 muA; CMOS process; DAC channel; DNL performance; built-in DFT; differential linearity performance; error correction; integral linearity errors; on-chip arithmetic logic unit; on-chip transfer function calibration scheme; programmable memory; resistor string DAC; voltage interpolation; Arithmetic; CMOS process; Calibration; Error correction; Interpolation; Linearity; Resistors; Testing; Transfer functions; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
Type :
conf
DOI :
10.1109/TEST.2005.1583962
Filename :
1583962
Link To Document :
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