DocumentCode :
3131204
Title :
Session 15: Green materials & process I
fYear :
2009
fDate :
21-23 Oct. 2009
Firstpage :
431
Lastpage :
431
Abstract :
Start of the above-titled section of the conference proceedings record.
Keywords :
Copper; Corrosion; Environmentally friendly manufacturing techniques; Failure analysis; Lead; Shape control; Thin films; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-4341-3
Type :
conf
DOI :
10.1109/IMPACT.2009.5382209
Filename :
5382209
Link To Document :
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