Title :
The effects of defects on high-speed boards
Author :
Parker, Kenneth P.
Author_Institution :
Agilent Technol.
Abstract :
Printed circuit boards are steadily becoming faster. They have higher clock speeds, and edge rates on data signals have dropped down into the 100´s of picoseconds. This presents some new challenges to the board test world because certain defects we did not do a good job covering in the past can no longer be ignored
Keywords :
printed circuit testing; high-speed boards defects; printed circuit boards; Capacitors; Circuit testing; Clocks; Connectors; Integrated circuit packaging; Moore´s Law; Optical propagation; Power transmission lines; Printed circuits; Signal design;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1583975
