• DocumentCode
    3131205
  • Title

    The effects of defects on high-speed boards

  • Author

    Parker, Kenneth P.

  • Author_Institution
    Agilent Technol.
  • fYear
    2005
  • fDate
    8-8 Nov. 2005
  • Lastpage
    187
  • Abstract
    Printed circuit boards are steadily becoming faster. They have higher clock speeds, and edge rates on data signals have dropped down into the 100´s of picoseconds. This presents some new challenges to the board test world because certain defects we did not do a good job covering in the past can no longer be ignored
  • Keywords
    printed circuit testing; high-speed boards defects; printed circuit boards; Capacitors; Circuit testing; Clocks; Connectors; Integrated circuit packaging; Moore´s Law; Optical propagation; Power transmission lines; Printed circuits; Signal design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2005. Proceedings. ITC 2005. IEEE International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-9038-5
  • Type

    conf

  • DOI
    10.1109/TEST.2005.1583975
  • Filename
    1583975
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3131205