DocumentCode :
3131366
Title :
High-power-used thermal gel degradation Evaluation on board-level HFCBGA subjected to reliability tests
Author :
Wang, Tong Hong ; Chen, Hsuan-Yu ; Lee, Chang-Chi ; Lai, Yi-Shao
Author_Institution :
Central Product Solutions, Adv. Semicond. Eng., Inc., Kaohsiung, Taiwan
fYear :
2009
fDate :
21-23 Oct. 2009
Firstpage :
465
Lastpage :
468
Abstract :
HFCBGA is a thermally enhanced FCBGA with its heat spreader extending heat conduction area by connecting itself to the rear side of the silicon die. A thermal interface material plays an important role as a heat conduction path. The thermal performance should be checked not only at time zero, several types of reliability tests have to be examined to cover the field condition faced by end user. Temperature cycling test, highly-accelerated temperature and humidity stress test and multiple reflows are chosen for investigating thermal resistance of junction to case of a selected thermal gel.
Keywords :
heat conduction; thermal management (packaging); board-level HFCBGA; heat conduction; heat spreader; hgh-power-used thermal gel degradation; highly-accelerated temperature; humidity stress test; reliability tests; temperature cycling test; thermal interface material; thermal resistance; Conducting materials; Humidity; Joining processes; Silicon; Temperature; Testing; Thermal conductivity; Thermal degradation; Thermal resistance; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-4341-3
Electronic_ISBN :
978-1-4244-4342-0
Type :
conf
DOI :
10.1109/IMPACT.2009.5382218
Filename :
5382218
Link To Document :
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