• DocumentCode
    3131497
  • Title

    The evaluation of assembly process for package on package components

  • Author

    Li, K.C. ; Ku, J.L. ; Lee, Andrew ; Huang, Jay C Y

  • Author_Institution
    Process Technol. Enabling & Mater. Characterization Div., Wistron Corp., Hsinchu, Taiwan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    493
  • Lastpage
    496
  • Abstract
    The Package on Package (PoP) component is getting attentions in mobile communication electronics industry to meet the miniaturization requirements. The 3D IC packaging technology is employed to achieve higher integrations for multiple functions. This also concurrently reduces the size of PCB during second level of interconnection. Currently, there are two major approaches for system manufactures. The first approach is to purchase the stacked PoP from component supplier. The alternative is to assemble the non-stacked PoP components in house. This study investigates the influences of soldering materials during top chip assembly. Two types of solder pastes and one paste flux are evaluated. The amount of dipping is also characterized. Dipping depths of 37% and 50% of the ball heights are considered. The bottom chips (test vehicle) are daisy chained with single electrical loop. The top chips have center loop and peripheral loop. The PoP components are placed onto center location and area near the edge to study the influence if any.
  • Keywords
    assembling; data loggers; integrated circuit interconnections; integrated circuit reliability; reflow soldering; solders; three-dimensional integrated circuits; 3D IC packaging technology; accelerated temperature cycling; assembly process evaluation; bottom chip assembly; components assembly; cross-sectioning; data logger; drop test; dye stain analysis; failure location; four point bending; nonstacked PoP components; package on package component; reflow soldering; side view microscopy; solder crack; solder joint failure; solder paste; stacked PoP; system manufacture; top chip assembly; x-ray analysis; Assembly; Components, packaging, and manufacturing technology; Electronics industry; Electronics packaging; Integrated circuit packaging; Mobile communication; Soldering; Testing; Three-dimensional integrated circuits; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382226
  • Filename
    5382226