DocumentCode :
3131497
Title :
The evaluation of assembly process for package on package components
Author :
Li, K.C. ; Ku, J.L. ; Lee, Andrew ; Huang, Jay C Y
Author_Institution :
Process Technol. Enabling & Mater. Characterization Div., Wistron Corp., Hsinchu, Taiwan
fYear :
2009
fDate :
21-23 Oct. 2009
Firstpage :
493
Lastpage :
496
Abstract :
The Package on Package (PoP) component is getting attentions in mobile communication electronics industry to meet the miniaturization requirements. The 3D IC packaging technology is employed to achieve higher integrations for multiple functions. This also concurrently reduces the size of PCB during second level of interconnection. Currently, there are two major approaches for system manufactures. The first approach is to purchase the stacked PoP from component supplier. The alternative is to assemble the non-stacked PoP components in house. This study investigates the influences of soldering materials during top chip assembly. Two types of solder pastes and one paste flux are evaluated. The amount of dipping is also characterized. Dipping depths of 37% and 50% of the ball heights are considered. The bottom chips (test vehicle) are daisy chained with single electrical loop. The top chips have center loop and peripheral loop. The PoP components are placed onto center location and area near the edge to study the influence if any.
Keywords :
assembling; data loggers; integrated circuit interconnections; integrated circuit reliability; reflow soldering; solders; three-dimensional integrated circuits; 3D IC packaging technology; accelerated temperature cycling; assembly process evaluation; bottom chip assembly; components assembly; cross-sectioning; data logger; drop test; dye stain analysis; failure location; four point bending; nonstacked PoP components; package on package component; reflow soldering; side view microscopy; solder crack; solder joint failure; solder paste; stacked PoP; system manufacture; top chip assembly; x-ray analysis; Assembly; Components, packaging, and manufacturing technology; Electronics industry; Electronics packaging; Integrated circuit packaging; Mobile communication; Soldering; Testing; Three-dimensional integrated circuits; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-4341-3
Electronic_ISBN :
978-1-4244-4342-0
Type :
conf
DOI :
10.1109/IMPACT.2009.5382226
Filename :
5382226
Link To Document :
بازگشت