Title :
Low cost multisite testing of quadruple band GSM transceivers
Author :
Zhang, Larry ; Heaton, Dale ; Largey, Hank
Author_Institution :
Texas Instruments, Inc., Dallas, TX
Abstract :
Multisite low cost production testing of quadruple band GSM/GPRS RF transceivers was designed for a low cost mixed signal tester with new RF sources, frequency mixing circuits, combiners, splitters, and switches. Special design considerations for the device under test load board have reduced cross talk between parallel sites and signal layout traces. Final production testing on dual sites have shown that a low cost test solution as implemented has higher throughput and better capabilities in several of the key tests on the device specification for GSM/GPRS transceivers, such as the Gaussian minimum shift keying (GMSK) modulated spectrum mask test, Synthesizer frequency lock time and transmitter frequency settle time tests, as well as receive channel noise figure tests
Keywords :
cellular radio; production testing; telecommunication equipment testing; transceivers; Gaussian minimum shift keying; frequency lock time; frequency settle time tests; mixed signal tester; multisite testing; noise figure tests; parallel sites; production testing; quadruple band GSM transceivers; signal layout traces; spectrum mask test; Circuit testing; Costs; Frequency shift keying; Frequency synthesizers; GSM; Ground penetrating radar; Production; Radio frequency; Signal design; Transceivers;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1583999
