• DocumentCode
    3131635
  • Title

    Determining shape and reflectance of Lambertian, specular, and hybrid surfaces using extended sources

  • Author

    Nayar, Shree K. ; Ikeuchi, Katsushi ; Kanade, Takeo

  • Author_Institution
    Robotics Inst., Carnegie-Mellon Univ., Pittsburgh, PA, USA
  • fYear
    1989
  • fDate
    10-12 Apr 1989
  • Firstpage
    169
  • Lastpage
    175
  • Abstract
    A method is presented for determining the shape of surfaces whose reflectance properties can vary from Lambertian to specular, without prior knowledge of the relative strengths of the Lambertian and specular components of reflection. The object surface is illuminated using extended light sources and is viewed from a single direction. Surface illumination using extended sources makes it possible to ensure the detection of both Lambertian and specular reflections. Multiple source directions are used to obtain an image sequence of the object. An extraction algorithm uses the set of image intensity values measured at each surface point to compute orientation as well as relative strengths of the Lambertian and specular reflection components. The method, photometric sampling, uses samples of a photometric function that relates image intensity to surface orientation, reflectance, and light source characteristics. Experiments conducted on Lambertian surfaces, specular surfaces, and hybrid surfaces show high accuracy in measured orientations and estimated reflectance parameters
  • Keywords
    computerised pattern recognition; computerised picture processing; Lambertian surfaces; detection; extended light sources; extended sources; extraction algorithm; hybrid surfaces; image intensity values; image sequence; multiple source directions; object surface; orientation; photometric function; photometric sampling; reflectance determination; reflectance properties; relative strengths; shape determination; specular reflections; specular surfaces; surface illumination; surface orientation; surface point; Data mining; Image sampling; Light sources; Lighting; Optical reflection; Photometry; Reflectivity; Rough surfaces; Shape measurement; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Applications of Machine Intelligence and Vision, 1989., International Workshop on
  • Conference_Location
    Tokyo
  • Type

    conf

  • DOI
    10.1109/MIV.1989.40544
  • Filename
    40544