• DocumentCode
    3131717
  • Title

    N-best error simulation for training spoken dialogue systems

  • Author

    Thomson, B. ; Gasic, M. ; Henderson, Mike ; Tsiakoulis, Pirros ; Young, Stephanie

  • Author_Institution
    Eng. Dept., Univ. of Cambridge, Cambridge, UK
  • fYear
    2012
  • fDate
    2-5 Dec. 2012
  • Firstpage
    37
  • Lastpage
    42
  • Abstract
    A recent trend in spoken dialogue research is the use of reinforcement learning to train dialogue systems in a simulated environment. Past researchers have shown that the types of errors that are simulated can have a significant effect on simulated dialogue performance. Since modern systems typically receive an N-best list of possible user utterances, it is important to be able to simulate a full N-best list of hypotheses. This paper presents a new method for simulating such errors based on logistic regression, as well as a new method for simulating the structure of N-best lists of semantics and their probabilities, based on the Dirichlet distribution. Off-line evaluations show that the new Dirichlet model results in a much closer match to the receiver operating characteristics (ROC) of the live data. Experiments also show that the logistic model gives confusions that are closer to the type of confusions observed in live situations. The hope is that these new error models will be able to improve the resulting performance of trained dialogue systems.
  • Keywords
    interactive systems; learning (artificial intelligence); natural language processing; regression analysis; Dirichlet distribution; N-best error simulation; ROC; logistic regression; receiver operating characteristics; reinforcement learning; simulated dialogue performance; simulated environment; training spoken dialogue systems; Generators; Logistics; Maximum likelihood estimation; Measurement; Semantics; Standards; Training; POMDP; Spoken dialogue systems; error simulation; reinforcement learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Spoken Language Technology Workshop (SLT), 2012 IEEE
  • Conference_Location
    Miami, FL
  • Print_ISBN
    978-1-4673-5125-6
  • Electronic_ISBN
    978-1-4673-5124-9
  • Type

    conf

  • DOI
    10.1109/SLT.2012.6424194
  • Filename
    6424194