• DocumentCode
    3131724
  • Title

    Balancing mask and lithography costs

  • Author

    Bonn, Jeffrey ; Sisler, Sharon ; Tivnan, Patricia

  • Author_Institution
    IBM Corp., Essex Junction, VT, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    25
  • Lastpage
    27
  • Abstract
    This paper describes a fundamental change in strategy to balance mask and lithography costs at a multi-technology, multi-part number IBM Microelectronics semiconductor fabricator. The strategy is to reduce mask costs by printing fewer chips in each exposure whenever it is cost effective to do so. This paper discusses the advantages and drawbacks of this strategy, describes ways to implement it with the least impact on lithography tool productivity, and shows how to calculate the cost trade-off between mask costs and lithography costs
  • Keywords
    integrated circuit economics; integrated circuit technology; manufacturing resources planning; masks; photolithography; strategic planning; chip printing per exposure; cost effectiveness; cost trade-off; lithography costs; lithography tool productivity; mask cost reduction; mask costs; mask/lithography cost balancing; multi-technology multi-part number semiconductor fabricator; production strategy; Costs; Lenses; Lithography; Manufacturing; Microelectronics; Printing; Production; Productivity; Rivers; Semiconductor device manufacture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference, 2001 IEEE/SEMI
  • Conference_Location
    Munich
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-6555-0
  • Type

    conf

  • DOI
    10.1109/ASMC.2001.925610
  • Filename
    925610