DocumentCode
3131803
Title
High reliability encapsulant liquid resin for SIP
Author
Nagai, Koichiro ; Ishikawa, Yuki ; Okuno, Atsush
Author_Institution
Semicond. Dept., Sanyu Rec Co., Ltd., Takatsuki, Japan
fYear
2009
fDate
21-23 Oct. 2009
Firstpage
546
Lastpage
549
Abstract
Liquid encapsulated resin and VPES (Vacuum Printing encapsulation systems) process were developed for SIP included FC and passive component, etc. with solder joint. In the case of RF module, PKG size can be made thin and small in comparison with the metal cap of the conventional technology. However, such module should repeatedly reflow for mounting on the mother board. Otherwise, it will cause the problem of the solder bridge inside of PKG when it is encapsulated by resin. In consideration of this point, this resin not only dropped down the coefficient of thermal expansion and the elastic modulus simultaneously, but also improved the adhesiveness. As a result, it is able to pass the severe pre-condition. Moreover, it succeeded in molding and underfilling simultaneously by using single-species resin in VPES process. Since there is no interface between underfill material and over mold resin inside of PKG, reliability can be improved further. This paper describes the unique of over molding process by VPES, liquid resin and its reliability.
Keywords
encapsulation; moulding; reflow soldering; reliability; resins; system-in-package; thermal expansion; PKG; coefficient of thermal expansion; elastic modulus; encapsulant liquid resin; over mold resin; solder bridge; system-in-package; underfill material; vacuum printing encapsulation systems; Encapsulation; Integrated circuit testing; Materials reliability; Packaging; Radio frequency; Resins; Semiconductor device reliability; Senior members; Thermal expansion; Vacuum systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location
Taipei
Print_ISBN
978-1-4244-4341-3
Electronic_ISBN
978-1-4244-4342-0
Type
conf
DOI
10.1109/IMPACT.2009.5382241
Filename
5382241
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