• DocumentCode
    3131803
  • Title

    High reliability encapsulant liquid resin for SIP

  • Author

    Nagai, Koichiro ; Ishikawa, Yuki ; Okuno, Atsush

  • Author_Institution
    Semicond. Dept., Sanyu Rec Co., Ltd., Takatsuki, Japan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    546
  • Lastpage
    549
  • Abstract
    Liquid encapsulated resin and VPES (Vacuum Printing encapsulation systems) process were developed for SIP included FC and passive component, etc. with solder joint. In the case of RF module, PKG size can be made thin and small in comparison with the metal cap of the conventional technology. However, such module should repeatedly reflow for mounting on the mother board. Otherwise, it will cause the problem of the solder bridge inside of PKG when it is encapsulated by resin. In consideration of this point, this resin not only dropped down the coefficient of thermal expansion and the elastic modulus simultaneously, but also improved the adhesiveness. As a result, it is able to pass the severe pre-condition. Moreover, it succeeded in molding and underfilling simultaneously by using single-species resin in VPES process. Since there is no interface between underfill material and over mold resin inside of PKG, reliability can be improved further. This paper describes the unique of over molding process by VPES, liquid resin and its reliability.
  • Keywords
    encapsulation; moulding; reflow soldering; reliability; resins; system-in-package; thermal expansion; PKG; coefficient of thermal expansion; elastic modulus; encapsulant liquid resin; over mold resin; solder bridge; system-in-package; underfill material; vacuum printing encapsulation systems; Encapsulation; Integrated circuit testing; Materials reliability; Packaging; Radio frequency; Resins; Semiconductor device reliability; Senior members; Thermal expansion; Vacuum systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382241
  • Filename
    5382241