Title :
Power-supply noise in SoCs: ATPG, estimation and control
Author :
Nourani, Mehrdad ; Radhakrishnan, Arun
Author_Institution :
Center for Integrated Circuits & Syst., Texas Univ., Dallas, TX
Abstract :
Noise on the power-supply lines has become a critical factor especially in low-voltage designs as excessive noise may cause intermittent functional error and eventually system failure. Having a realistic picture of the worst case noise throughout a chip is important as we can devise a remedy to alleviate the problem before it becomes too late. This paper provides a fast automatic pattern generation method to estimate the maximum simultaneous switching noise for a non-embedded core. When the cores are integrated within a SoC, the combined noise is far from a simple additive behavior. We offer a heuristic to estimate the power-supply noise in core-based SoCs. This heuristic can be employed to minimize the number of power-supply lines/pins while keeping the noise under control. The experiments using ISCAS´85 benchmarks verify that our power-supply noise methodology is fairly fast and accurate and can be used for effective power-supply distribution
Keywords :
automatic test pattern generation; integrated circuit noise; integrated circuit testing; logic testing; system-on-chip; ATPG; SoC; automatic test pattern generation; nonembedded core; power-supply lines; power-supply noise; power-supply pins; system-on-chip; Additive noise; Analytical models; Automatic test pattern generation; Circuit faults; Circuit noise; Integrated circuit noise; Noise generators; Power generation; Power system modeling; Testing;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584011