Forming N-detection test sets from one-detection test sets without test generation

We describe a procedure for forming n-detection test sets for n > 1 without applying a test generation procedure to target faults. The proposed procedure accepts a one-detection test set. It extracts test cubes for target faults from the one-detection test set. It then merges the cubes in different ways to obtain an n-detection test set. We demonstrate that the resulting test set is as effective as an n-detection test set generated by a deterministic test generation procedure in detecting untargeted faults. Merging of cubes does not require test generation or fault simulation. Fault simulation is required for extracting test cubes for target faults