Title :
Layering of the STIL extensions
Author :
Maston, Greg ; Taylor, Tony
Author_Institution :
Synopsys Inc., Mountain View, CA
Abstract :
STIL consists of a series of standards under the IEEE 1450 label. Some of these efforts are approved, others in balloting, and others still being defined. This paper identifies the various efforts and discusses the motivations for the partitioning of these efforts. Industry concerns with this partitioning are presented, and an option to lower the barrier to acceptance for these efforts is identified
Keywords :
IEEE standards; logic CAD; logic partitioning; logic testing; IEEE 1450 standard; standard test interface language; Authorization; Automatic test pattern generation; Automatic testing; Electronic design automation and methodology; Proposals; Standards development; Standards publication; Timing; Transportation;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584016
