• DocumentCode
    3131925
  • Title

    Performance tests on a novel vapor chamber

  • Author

    Hsieh, Kuo-Chun ; Wong, Shwin-Chung

  • Author_Institution
    Dept. of Power Mech. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    573
  • Lastpage
    576
  • Abstract
    The performance of a novel vapor chamber is tested in this study. In this vapor chamber, parallel grooves are made on the inner surface of the top plate, with inter-groove openings, to replace the conventional porous wick. To the inner surface of the bottom plate is sintered a layer of porous wick as the evaporator. The peaks of the groove walls directly contact with the wick so that the grooves function as vapor path, condenser and structural supporters simultaneously. The corrugated groove walls provide not only an enlarged condensation area, but also a direct shortcut for a portion of the liquid condensed on the groove surface to be absorbed back to the wick. Thus, smaller liquid-flow resistance and hence high anti-dryout capability are achieved. The test module includes a copper plate-fin heat sink in combination with a top fan. In this study, the evaporator wick was made of sintered multi-layer copper screens and the footprint of the vapor chamber was 10 cm × 8.9 cm. With a 2.1 cm × 2.1 cm or a 1.1 cm × 1.1 cm heating area, the vapor chamber resistances were measured for heat load increasing from 80 W to beyond 300 W. Good performances with low vapor chamber resistance and large heat load limit were obtained under different orientations.
  • Keywords
    copper; heat sinks; porous materials; sintering; Cu; condenser; corrugated groove walls; evaporator; inter-groove openings; liquid-flow resistance; parallel grooves; plate-fin heat sink; porous wick; power 80 W to 300 W; structural supporters; vapor chamber resistances; vapor path; Aluminum; Containers; Copper; Corrugated surfaces; Electronics cooling; Heat sinks; Resistance heating; Surface resistance; Testing; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382249
  • Filename
    5382249