DocumentCode
3131925
Title
Performance tests on a novel vapor chamber
Author
Hsieh, Kuo-Chun ; Wong, Shwin-Chung
Author_Institution
Dept. of Power Mech. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear
2009
fDate
21-23 Oct. 2009
Firstpage
573
Lastpage
576
Abstract
The performance of a novel vapor chamber is tested in this study. In this vapor chamber, parallel grooves are made on the inner surface of the top plate, with inter-groove openings, to replace the conventional porous wick. To the inner surface of the bottom plate is sintered a layer of porous wick as the evaporator. The peaks of the groove walls directly contact with the wick so that the grooves function as vapor path, condenser and structural supporters simultaneously. The corrugated groove walls provide not only an enlarged condensation area, but also a direct shortcut for a portion of the liquid condensed on the groove surface to be absorbed back to the wick. Thus, smaller liquid-flow resistance and hence high anti-dryout capability are achieved. The test module includes a copper plate-fin heat sink in combination with a top fan. In this study, the evaporator wick was made of sintered multi-layer copper screens and the footprint of the vapor chamber was 10 cm à 8.9 cm. With a 2.1 cm à 2.1 cm or a 1.1 cm à 1.1 cm heating area, the vapor chamber resistances were measured for heat load increasing from 80 W to beyond 300 W. Good performances with low vapor chamber resistance and large heat load limit were obtained under different orientations.
Keywords
copper; heat sinks; porous materials; sintering; Cu; condenser; corrugated groove walls; evaporator; inter-groove openings; liquid-flow resistance; parallel grooves; plate-fin heat sink; porous wick; power 80 W to 300 W; structural supporters; vapor chamber resistances; vapor path; Aluminum; Containers; Copper; Corrugated surfaces; Electronics cooling; Heat sinks; Resistance heating; Surface resistance; Testing; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location
Taipei
Print_ISBN
978-1-4244-4341-3
Electronic_ISBN
978-1-4244-4342-0
Type
conf
DOI
10.1109/IMPACT.2009.5382249
Filename
5382249
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