DocumentCode :
3131927
Title :
Analysis of error-masking and X-masking probabilities for convolutional compactors
Author :
Arai, Masayuki ; Fukumoto, Satoshi ; Iwasaki, Kazuhiko
Author_Institution :
Tokyo Metropolitan Univ.
fYear :
2005
fDate :
8-8 Nov. 2005
Lastpage :
570
Abstract :
Convolutional compactors offer a promising technique of compacting test responses that include unknown values. One drawback of this compaction technique is error masking, i.e., some errors appearing in the test responses cannot be detected due to mutual cancellation. In this work, we theoretically analyze error-masking probability. First, we apply weight distributions of binary linear error-correcting codes to derive the error-masking probability. We then present a fast calculation scheme for 4- and 6-error-masking probabilities. Numerical examples reveal that they are about the same as those obtained by Monte-Carlo simulations. We also analyze X-masking probability, that is, the probability that an error is masked by unknown values. We present tree-search-based calculation, as well as approximated value
Keywords :
built-in self test; data compression; error handling; integrated circuit testing; logic testing; probability; Monte-Carlo simulations; X-masking probability; binary linear error-correcting codes; convolutional compactors; error-masking probability; numerical examples; tree-search-based calculation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Convolutional codes; Costs; Error analysis; Error correction codes; Probability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
Type :
conf
DOI :
10.1109/TEST.2005.1584017
Filename :
1584017
Link To Document :
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