• DocumentCode
    3131966
  • Title

    Capacity analysis tool

  • Author

    Sisler, Sharon ; Merrill, Edward ; Sorrentino, Phillip

  • Author_Institution
    Microelectron. Div., IBM Corp., Essex Junction, VT, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    77
  • Lastpage
    79
  • Abstract
    This paper describes a capacity analysis tool developed to quickly screen potential wafer profiles for a multi-technology, multi-part number, IBM Microelectronics semiconductor fabricator. This tool identifies constraints and opportunities within the fabricator, as well as capacity shortages of key tool sets for a given wafer load. Quicker capacity analysis was demanded not only by a more dynamic market, but also by new strategies to exclusively manufacture logic and pursue OEM market opportunities
  • Keywords
    integrated circuit manufacture; integrated logic circuits; manufacturing resources planning; process monitoring; production control; OEM market opportunities; capacity analysis tool; capacity shortages; dynamic market; logic manufacture; multi-technology multi-part number semiconductor fabricator; potential wafer profile screening; tool sets; wafer load; Etching; Linear programming; Lithography; Logic; Market opportunities; Microelectronics; Rivers; Semiconductor device manufacture; Strips; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference, 2001 IEEE/SEMI
  • Conference_Location
    Munich
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-6555-0
  • Type

    conf

  • DOI
    10.1109/ASMC.2001.925620
  • Filename
    925620