DocumentCode
3132004
Title
Effect of surface roughness of silicon die and copper heat spreader on thermal performance of HFCBGA
Author
Wang, Tong Hong ; Paisner, Sara N. ; Lee, Chang-Chi ; Chen, Susan ; Lai, Yi-Shao
Author_Institution
Adv. Semicond. Eng., Inc., Kaohsiung, Taiwan
fYear
2009
fDate
21-23 Oct. 2009
Firstpage
581
Lastpage
584
Abstract
From the available mass production devices of HFCBGAs, there can be a range of surface roughness with different surface finished of silicon dies and heat spreader. An aluminum filled gel is used to examine the surfaces clamping with both identical substrates at both sides whether compatible to the thermal conduction. Their thermal contact resistances are measured by laser flash technology and therefore modeling HFCBGAs with those measured roughnesses and resistances for characterizing thermal performances.
Keywords
aluminium; ball grid arrays; copper; flip-chip devices; heat sinks; measurement by laser beam; silicon; surface roughness; thermal management (packaging); AlJkJk; Cu; HFCBGA thermal performance; Si; aluminum filled gel; copper heat spreader; flip chip ball grid array; laser flash technology; surface roughness; surfaces clamping; thermal contact resistance; Aluminum; Clamps; Copper; Electrical resistance measurement; Mass production; Rough surfaces; Silicon; Surface finishing; Surface roughness; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location
Taipei
Print_ISBN
978-1-4244-4341-3
Electronic_ISBN
978-1-4244-4342-0
Type
conf
DOI
10.1109/IMPACT.2009.5382251
Filename
5382251
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