Title :
Effect of surface roughness of silicon die and copper heat spreader on thermal performance of HFCBGA
Author :
Wang, Tong Hong ; Paisner, Sara N. ; Lee, Chang-Chi ; Chen, Susan ; Lai, Yi-Shao
Author_Institution :
Adv. Semicond. Eng., Inc., Kaohsiung, Taiwan
Abstract :
From the available mass production devices of HFCBGAs, there can be a range of surface roughness with different surface finished of silicon dies and heat spreader. An aluminum filled gel is used to examine the surfaces clamping with both identical substrates at both sides whether compatible to the thermal conduction. Their thermal contact resistances are measured by laser flash technology and therefore modeling HFCBGAs with those measured roughnesses and resistances for characterizing thermal performances.
Keywords :
aluminium; ball grid arrays; copper; flip-chip devices; heat sinks; measurement by laser beam; silicon; surface roughness; thermal management (packaging); AlJkJk; Cu; HFCBGA thermal performance; Si; aluminum filled gel; copper heat spreader; flip chip ball grid array; laser flash technology; surface roughness; surfaces clamping; thermal contact resistance; Aluminum; Clamps; Copper; Electrical resistance measurement; Mass production; Rough surfaces; Silicon; Surface finishing; Surface roughness; Thermal resistance;
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-4341-3
Electronic_ISBN :
978-1-4244-4342-0
DOI :
10.1109/IMPACT.2009.5382251