• DocumentCode
    3132004
  • Title

    Effect of surface roughness of silicon die and copper heat spreader on thermal performance of HFCBGA

  • Author

    Wang, Tong Hong ; Paisner, Sara N. ; Lee, Chang-Chi ; Chen, Susan ; Lai, Yi-Shao

  • Author_Institution
    Adv. Semicond. Eng., Inc., Kaohsiung, Taiwan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    581
  • Lastpage
    584
  • Abstract
    From the available mass production devices of HFCBGAs, there can be a range of surface roughness with different surface finished of silicon dies and heat spreader. An aluminum filled gel is used to examine the surfaces clamping with both identical substrates at both sides whether compatible to the thermal conduction. Their thermal contact resistances are measured by laser flash technology and therefore modeling HFCBGAs with those measured roughnesses and resistances for characterizing thermal performances.
  • Keywords
    aluminium; ball grid arrays; copper; flip-chip devices; heat sinks; measurement by laser beam; silicon; surface roughness; thermal management (packaging); AlJkJk; Cu; HFCBGA thermal performance; Si; aluminum filled gel; copper heat spreader; flip chip ball grid array; laser flash technology; surface roughness; surfaces clamping; thermal contact resistance; Aluminum; Clamps; Copper; Electrical resistance measurement; Mass production; Rough surfaces; Silicon; Surface finishing; Surface roughness; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382251
  • Filename
    5382251