• DocumentCode
    3132102
  • Title

    Improved mean shift algorithm with multi-cue integration and histogram intersection

  • Author

    Dun, Mao ; Jianghu, Xu

  • Author_Institution
    Electron. Eng. Coll., Naval Univ. of Eng., Wuhan, China
  • Volume
    2
  • fYear
    2011
  • fDate
    20-21 Aug. 2011
  • Firstpage
    142
  • Lastpage
    146
  • Abstract
    The mean shift tracker is commonly used in realtime target tracking. However, the original mean shift tracker employs only color feature and uses the Bhattacharya coefficient as similarity measure, resulting in low tracking accuracy. This paper proposed a novel tracking algorithm, which integrated color and texture features and employed histogram intersection and Powell´s method to track. Firstly, texture feature was extracted by the Local Binary Pattern texture operator and integrated with color feature adaptively. Log-likelihood ratio histogram was proposed to represent objects instead of histogram. Then, the rough location of the target was obtained by the mean shift algorithm based on the two features. Finally, histogram intersection was defined as the similarity metric between the target model and candidates and iteratively maximized by Powell´s method. Experimental results demonstrate the proposed method can track targets more accurately and fast.
  • Keywords
    feature extraction; image colour analysis; image texture; iterative methods; target tracking; Bhattacharya coefficient; Powell method; color feature; histogram intersection; improved mean shift tracker algorithm; iterative method; local binary pattern texture operator; log-likelihood ratio histogram; multicue integration; realtime target tracking; texture feature extraction; Color; Feature extraction; Histograms; Image color analysis; Target tracking; Vectors; Mean Shift; Powell´s method; histogram intersection; multi-cue integration; target tracking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computing, Control and Industrial Engineering (CCIE), 2011 IEEE 2nd International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-9599-3
  • Type

    conf

  • DOI
    10.1109/CCIENG.2011.6008087
  • Filename
    6008087