• DocumentCode
    3132150
  • Title

    Test connections - tying application to process

  • Author

    Carulli, John M., Jr. ; Anderson, Thomas J.

  • Author_Institution
    Texas Instruments Inc., Dallas, TX
  • fYear
    2005
  • fDate
    8-8 Nov. 2005
  • Lastpage
    686
  • Abstract
    The ability to meet ever more demanding customer quality and reliability requirements is becoming increasingly difficult with each advancing technology generation. This issue becomes more complex as customer applications and requirements become more varied for the same basic technology. The customer applications range from cell phones and PDAs to servers to automotive. The reliability requirement descriptions vary from hundreds of defective parts per million (DPPM) to five nines availability to a zero defects culture. This paper focus on how customer quality and reliability expectations are influencing the perception and direction of test
  • Keywords
    customer satisfaction; production testing; quality assurance; reliability; customer applications; quality requirement; reliability requirements; test connections; Automotive engineering; Copper; Data mining; Dielectrics; Personal digital assistants; Power system reliability; Process design; Silicides; Space technology; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2005. Proceedings. ITC 2005. IEEE International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-9038-5
  • Type

    conf

  • DOI
    10.1109/TEST.2005.1584030
  • Filename
    1584030