DocumentCode :
3132175
Title :
Chemical supplier quality management: the changes and challenges
Author :
O´Brien, John ; Leslie, Terry
Author_Institution :
Dominion Semicond., Manassas, VA, USA
fYear :
2001
fDate :
2001
Firstpage :
141
Lastpage :
143
Abstract :
Over the years the semiconductor industry has undergone tremendous change. The changes in technology are obvious but in addition to these, there have also been significant changes in the supplier quality management system. Some were driven by various quality programs, but others were necessary due to other issues such as container sizes (bottles to bulk containers), inventory control (high inventory levels to a just-in-time (JIT) approach), more stringent specifications (parts/million (ppm) impurities to parts/trillion (ppt) impurities), and resource issues (re-engineering, alternate suppliers). Many of these factors have necessitated changes and created challenges for companies in handling their supplier quality management programs. The goal of any supplier quality management program is to provide defective-free material to manufacturing. The impact of these factors on the supplier quality management program is discussed
Keywords :
impurities; integrated circuit manufacture; integrated circuit technology; quality management; stock control; surface contamination; alternate suppliers; bottles; bulk containers; chemical supplier quality management; container sizes; defective-free material; impurity levels; inventory control; inventory levels; just-in-time approach; quality programs; re-engineering; resource issues; semiconductor industry; stringent specifications; supplier quality management program; supplier quality management programs; supplier quality management system; Chemical technology; Containers; Electronics industry; Flowcharts; Impurities; Inventory control; Quality management; Sampling methods; Semiconductor device manufacture; Semiconductor materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference, 2001 IEEE/SEMI
Conference_Location :
Munich
ISSN :
1078-8743
Print_ISBN :
0-7803-6555-0
Type :
conf
DOI :
10.1109/ASMC.2001.925637
Filename :
925637
Link To Document :
بازگشت