Title :
A methodology for testing one-hot transmission gate multiplexers
Author :
McLaurin, Teresa L. ; Frederick, Frank ; Slobodnik, Rich
Author_Institution :
ARM Inc., Austin, TX
Abstract :
There is a myriad of issues that arise when testing a device. One such issue is the testing of one-hot transmission gate (T-gate) multiplexers. Around the industry several different methodologies are used and additional hardware may be required to test this circuit. These methods may not address quality of test and not all of them is discussed in this paper. This paper show that a high quality test can occur on one-hot T-gate multiplexers without additional hardware
Keywords :
multiplexing equipment; telecommunication equipment testing; T-gate multiplexers; high quality test; one-hot transmission gate multiplexers; Automatic test pattern generation; Circuit faults; Circuit testing; Decoding; Delay; Flip-flops; Hardware; Libraries; Logic; Multiplexing;
Conference_Titel :
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-9038-5
DOI :
10.1109/TEST.2005.1584033
