• DocumentCode
    3132270
  • Title

    Logic proximity bridges

  • Author

    Tran, Eric N. ; Krishna, Vamsee ; Zachariah, Sujit ; Chakravarty, Sreejit

  • fYear
    2005
  • fDate
    8-8 Nov. 2005
  • Lastpage
    761
  • Abstract
    The notion of logic proximity bridge (LPB) is introduced. An algorithm to enumerate LPBs, using only the logic net-list, is discussed. Although no correlation exist between the LPB list and the realistic bridge list, LPB patterns are shown to compare very favorably with realistic bridge and n-detect patterns on several coverage metrics. This result points to the potential for LPB patterns as an alternative to both realistic bridge and n-detect patterns
  • Keywords
    automatic test pattern generation; fault diagnosis; logic testing; coverage metrics; logic net-list; logic proximity bridges; n-detect patterns; Bridges; Data analysis; Data mining; Educational institutions; Fault detection; Logic testing; Manufacturing; Scalability; Silicon; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2005. Proceedings. ITC 2005. IEEE International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-9038-5
  • Type

    conf

  • DOI
    10.1109/TEST.2005.1584038
  • Filename
    1584038